Abstract

Cesium lead triiodide (CsPbI3) is an attractive material for photovoltaic applications due to its appropriate band gap, strong optical absorption, and high thermal stability. However, the perovskite phase suffers from moisture induced structural instability. Previous studies have utilized a range of solvent systems to establish the role of solvent choice in structural instabilities. Despite this, effects of different solvents on the electronic structure of this material have not been compared. We report substantial chemical and compositional differences in thin films of CsPbI3 prepared from a range of solvent systems. We confirm via X-ray diffraction thin films formed from DMF, DMSO, and a mixture of these solvent systems share the same crystal structure. However, secondary ion mass spectrometry, X-ray photoelectron spectroscopy, and low energy ion scattering measurements reveal significant differences between films processed via different solvent systems. Our findings reveal the critical impact solvents have upon compositional stoichiometry and thin-film morphology.

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