Abstract
A numerical deconvolution procedure has been developed to measure X-ray diffraction data from partially oriented specimens to the highest possible resolution. The resolution to which X-ray data from non-crystalline specimens can be measured is limited by the disorientation of the particles in the specimen. The distribution of particle orientations causes the X-ray reflections to be smeared into arcs about the center of the diffraction pattern. At sufficiently high diffraction angles, this arcing results in the overlap of adjacent reflections. Conventional methods of densitometry used to measure intensities from X-ray films cannot be used in this region. By measuring all the optical densities on an X-ray film and placing them on a polar grid, an angular deconvolution can be performed to correct for the disorientation and separate the intensities from overlapping reflections. This calculation results in a determination of the X-ray intensities and background, and a quantitative measurement of the highest possible resolution to which the data can be reliably measured. X-ray data from partially oriented specimens of several macromolecular aggregates have been collected with this method.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
