Abstract
The processing conditions, microstructure, and dielectric properties of strontium bismuth niobate vanadate ceramics, SrBi2(VxNb1−x)2O9 (SBVN, with 0 ≤x≤ 0.3), were systematically studied. A relative density of >90% was obtained for all the samples using a two‐step sintering process. XRD showed that a single phase with the layered perovskite structure of SrBi2Nb2O9 (SBN) was formed with a vanadium content of up to 30 at.%. SEM revealed that the average grain size decreased gradually with an increase in vanadium content. The Curie point was found to gradually increase from ∼418°C for SBN to ∼459°C for SBVN with 30 at.% vanadium. Dielectric constants at room temperature and their respective Curie points were found to peak at a composition with 10–15 at.%; vanadium. Moreover, a high concentration of vanadium (>5 at.%) resulted in a significant increase in tangent loss at low frequencies (<1000 Hz). The relationships between chemical composition, processing condition, microstructure, and dielectric properties of SBVN ferroelectric ceramics are discussed.
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