Abstract

In the paper, amorphous microwires of [(Zr43Cu50Al7)99.5Si0.5]99.9Y0.1 (Zr43) and Zr50.5Cu27.45Ni13.05Al9 (Zr50.5) alloys were fabricated by the melt-extraction technique. Their mechanical properties were evaluated by carrying out tensile and bending tests which show they have nearly the same strength. The cryogenic resistivity of CuZr-based amorphous microwires was investigated by four point probe method below 300K. With the temperature increasing, the resistivity of these microwires decreases. Temperature coefficient of resistivity of these wires is close to zero, which manifests potential application as precision resistance material for its constant resistivity in such wide range of temperature.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.