Abstract
A polymer/ceramic composite grain boundary capacitor has been fabricated using a semiconducting ceramic as the conducting phase (reduced barium titanate) and a thermoplastic polyimide as the insulating polymer phase (LaRC-TPI). The ceramic grains and the composite capacitors were characterized using scanning and transmission electron microscopy. The dielectric properties of the capacitors were also measured using an impedance analyser. A composite grain boundary capacitor with a dielectric loss below 0.02 was successfully manufactured. The room temperature dielectric constant of the capacitors ranged from below 30 to approximately 2000, with the value dependent upon the ratio of the diameter of the semiconducting ceramic grains to the thickness of the insulating polymer layer coating the grains.
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