Abstract

In recent years, Gadolinium Doped Ceria (GDC) barrier layers have been reported to enhance the performance of Solid Oxide Fuel Cells (SOFCs)by reducing cathode/electrolyte interface diffusion and improving ionic conductivity. Prior investigations have demonstrated that GDC thin film sputtered at room-temperature yields substantial enhancements in Solid Oxide Fuel Cells (SOFCs).This enhancement is evidenced by a noteworthy increase in output current (+78%) and a considerable reduction in ohmic resistance (up to -42%), compared to conventionally screen-printed industrial SOFCs. To probe the intricate interplay between morphology and stoichiometry, which fundamentally determines the Ce3+/Ce4+ ratio governing both ionic and electronic conductivity, this study utilized quantitative X-ray Photoelectron Spectroscopy (XPS) and X-ray Absorption Spectroscopy (XAS) techniques. Results revealed that annealing parameters played a role in the number of available oxygen vacancies in the oxygen-reduction reaction (ORR), inducing different changes in the investigated samples. Non-destructive investigations utilizing Distribution of Relaxation Time (DRT) analysis were conducted on two short stacks with varying thickness, employing different sputtering Modalities. These studies revealed that thickness significantly influences the ultimate performance.

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