Process Capability Plots for One-Sided Specification Limits

Abstract

We extend the idea of process capability plots from the case of two-sided specification intervals to derive a graphical method useful when doing capability analysis having one-sided specification limits. The derived process capability plots are based on existing capability indices for one-sided specification limits. Both the cases with and without a target value are investigated. Under the assumption of normality we suggest estimated process capability plots to be used to assess process capability at a given significance level. Theoretical results are given for determining the significance level as well as power for the method. The presented graphical approach is helpful to determine if it is the variability, the deviation from target, or both that need to be reduced to improve the capability. Examples are presented.