Abstract
The switching of YBCO thin films under high current load is fundamental for fault current limiters and active power switches. Its mechanism is still under debate, however, with thermal and nonthermal models being discussed. To clarify the situation, we have placed an array of thermometers directly on top of a YBCO strip and have measured the quench propagation with high spacio-temporal resolution. We compare the results with a numerical model of heat diffusion in 3D with temperature dependent material parameters and find nearly quantitative agreement. This confirms thermal runaway as the mechanism of switching.
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