Probing the Spin State of Spin-Crossover Complexes on Surfaces with Vacuum Ultraviolet Angle-Resolved Photoemission Spectroscopy

Abstract

Spin-crossover complexes in direct contact with substrates have sparked considerable interest, in particular, in view of their potential applications in molecular electronics. While a huge number of spin-crossover complexes is available, many of them are not robust enough to withstand the sample preparation and/or the interaction with the substrate. The techniques usually employed for these investigations, namely, near-edge X-ray absorption fine structure spectroscopy and low-temperature scanning tunneling microscopy, are not adapted for systematic studies because of the limited access to synchrotron-radiation facilities and complexity of the (indirect) spin determination, respectively. Here, we detail a methodology using a (more) commonly available technique, namely, vacuum ultraviolet (angle-resolved) photoemission spectroscopy, to determine the spin state of layers of three different spin-crossover complexes with thicknesses down to the submonolayer regime. We present an approach to determine the thicknesses of the investigated layers, relying on the inelastic mean free path of electrons determined from combined photoemission and X-ray absorption measurements. We report on the high-spin to low-spin relaxation dynamics of spin-crossover (SCO) layers and the influence of the ultraviolet light on these dynamics. While the observed relaxation processes occur on a timescale on the order of minutes, probing spin-state dynamics on the picosecond timescale is foreseeable with pump–probe photoemission spectroscopy.