Abstract
Atomic force microscopy (AFM) has been used to investigate the organization of the collagen layer present on polymer substrata after adsorption and drying, while the adsorbed amount was monitored using X-ray photoelectron spectroscopy (XPS) and radiochemical measurements. Differences in the organization of the adsorbed collagen layer (surface coverage, layer thickness) observed by AFM fitted well with those found by models obtained from XPS and radiolabeling data.
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