Probing the erbium ion distribution in silica optical fibers with fluorescence based measurements

Abstract

Accurate determination of the rare earth dopant distribution in optical fibers enhances our understanding of the fiber manufacture process and enables further improvement in the design of fiber based products such as optical fiber lasers and amplifiers. Here a simple theoretical model consisting of an ensemble of rate equation systems, characteristic of the most likely electronic transitions that take place in the vicinity of erbium (Er 3+) doped silica glasses, is developed and solved. Through this theoretical study it is established that information about the relative Er 3+ ion distribution in fibers can be inferred by simply monitoring the backscattered fluorescence signal originating from the de-excitation of specific energy levels in the investigated samples. Following these theoretical studies a fluorescence intensity confocal optical microscopy (FICOM) scheme was employed to investigate the Er 3+ ion distribution profiles in a range of silica optical fibers. The validity of the proposed theoretical model was confirmed through a comparison of the Er 3+ ion distribution profiles acquired using the FICOM technique and those obtained from the application of a powerful analytical ion probe.