Abstract

Ultrafast transmission electron microscopy (UTEM) is a powerful tool to study the dynamics of nanoscale systems, combining the versatile imaging, diffraction and spectroscopy capabilities of state-of-the-art TEM with femtosecond temporal resolution of a laser pump/electron probe scheme [1,2]. In particular, inelastic scattering between a free electron pulse and strong optical near fields [3,4] (Fig.1a) allows for a coherent manipulation of the electron quantum state. In this mechanism, the optical field imprints a sinusoidal phase modulation on the electron wave function [4], which manifests in a comb of photon sidebands in the kinetic energy distribution (Fig.1b) and — by energy-filtering — enables photon-induced near-field electron microscopy (PINEM) [3].

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.