Abstract
Epitaxial (1 0 0) thin films of CrO2 were fabricated by chemical vapour deposition technique onto TiO2 (1 0 0) single-crystal substrates. X-band (9.5 GHz) ferromagnetic resonance studies reveal that magnetic anisotropy parameters in the series prepared using CrO2Cl2 liquid precursor show only slight variations with thickness, contrary to their strong dependence observed in the CrO3-based films. The different behaviour was attributed to different morphologies of the films prepared using solid and liquid precursors.
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