Abstract
Tungsten field emitter tips are frequently being used in electron, scanning tunneling and point projection microscopes. To characterize the electronic properties as well as the electron and ion emission behavior for ultrasharp tungsten needles, we have carried out energy-resolved measurements. Hemispherical mirror and retarding potential analyses of field-emitted electrons and ions have been combined with FEM/FIM examinations of [111]-oriented tungsten emitter prepared in different ways, for example by neon ion sputtering and by a thermo-field treatment, creating a single atomically sharp microprotrusion. In the electron emission mode the free electron gas approximation gives satisfactory fits to the total energy distributions measured to date. Argon ion energy distributions show a field-dependent high energy secondary structure possibly indicating a field-gradient-enhanced migration of molecules, such as water, to the microprotrusion.
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