Abstract
The probe beam deflection technique was employed to follow the ion transport and ion exchange processes taking place in the course of redox transformations of indium-hexacyanoferrate surface layers. In accordance with the results of quartz crystal microbalance studies it was established that the principal charge compensating ions are cations. The data analysis by the help of a convolution method attested that the contribution of anions to the charge neutralization inside the film below 0.9 V versus SCE is less than 7%, if any at all.
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