Abstract
One of the key challenges in organic light-emitting diodes (OLEDs) for lighting applications is efficient light extraction from the planar, multi-layered OLED stack. Several different light extraction approaches are being explored currently by researchers, however characterizing light extraction films after fabricating OLEDs is not a viable approach when the outcoupling films have large surface roughness and is time consuming as well. Here we apply prism coupling method (PCM), a simple and elegant tool, to characterize outcoupling films. We show the effectiveness of PCM in estimating light extraction efficiency of outcoupling films. PCM can expedite selection and optimization of various light extraction approaches without the need to build OLEDs. The experimental results are corroborated by the optical simulations done using ray tracing method taking into account Mie scattering from wavelength sized spherical inclusions in an outcoupling film.
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