Abstract
AbstractElectron microscopy, using microscopes with conventional magnetic lenses is restructed in resolution by spherical aberration. The “zonal correction principle” allows to surpass this limit. Its use in image reconstruction schemes allows to separate the influence of defocusing, astigmatism etc. from the physical significant structure. The use of threedimensional methods and of image difference methods will be necessary in order to get interpretable results in the study of the not “infinitely thin” objects in electronmicroscopy at atomic level. The use of redundancy principles (similar as in X‐ray structure determination) will be discussed and demonstrated. The most severe difficulty – especially in electron microscopy of organic specimen – will be radiation damage.
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