Abstract
AbstractOne of the factors that contributes to the recent considerable reduction in the size and high integration of electronics and other devices is the miniaturization of the electronic components that they contain. In addition, new fine functional materials have been developed and widely used in fields including the automobile, aviation, metal, and chemical industries. As a result, higher accuracy and resolving power are required for minute three‐dimensional measurement of these components and materials. Although a variety of devices are available to satisfy these requirements, the confocal microscope is gathering attention as the device of choice for easy three‐dimensional, non‐contact surface profile measurements in air.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
