Abstract

ABSTRACTWe describe PC- based software which calculates grazing incidence X-ray reflectivity profiles from model thin film structures, including interface grading. We discuss the mathematical principles of the model and benchmark tests for speed of operation on two PC compatible machines are presented. Curvature of the specimen results in selective loss of fringe visibility at low scattering vectors and is treated rigorously. We discuss the treatment of roughness and use a generalized formula that is valid at large and small values of the reflectivity; its effects are illustrated using the program.

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