Principles and applications of a comprehensive characterization method combining synchrotron radiation technology, transmission electron microscopy, and density functional theory

Abstract

<p indent="0mm">Synchrotron radiation and transmission electron microscopy (TEM) technologies are important characterization methods of materials and are widely used in the frontier research fields of physics, chemistry, materials, environment, and energy. Both methods exploit the interaction of photons and electrons with materials, including the scattering and absorption of photons in the material and the diffraction and energy loss of electrons. Through these techniques, various specific characterization methods have evolved. In the density functional theory (DFT) which is based on quantum mechanics, the eigenfunction can be related to the charge density obtained from the synchrotron radiation X-rays diffraction and electron diffraction in TEMs, and the eigenvalue corresponds to the energy level or band structure obtained from the photoelectron emission spectra/absorption spectra of synchrotron radiation and the electron energy loss spectra of TEM. With these corresponding relations, the two techniques and theoretical calculations can verify and/or complement each other, providing detailed analyses of the structure and electronic information of materials. This article reviews the progress of synchrotron radiation and transmission electron microscopy technologies and their applications to typical material characterization. The article emphasizes how the spatial and temporal resolutions of both technologies have advanced through nanotechnology and quantum mechanics developments. Such cutting-edge technology will promote the discovery of new functional materials.