Abstract
Scan test is widely used in integrated circuit test. However, the excellent observability and controllability provided by the scan test gives attackers an opportunity to obtain sensitive information by using scan design to threaten circuit security. Hence, the primary motivation of this paper is to improve the existing DFT technique, i.e., to enhance the chip security on the premise of guaranteeing test quality. In this paper, we propose a new scan design method against scan-based side-channel attack. In the proposed method, the encryption structure is adopted, which requires the correct test authorization code to carry out normal test operation. Without the correct test authorization, the attackers cannot obtain the desired scan data, preventing the scan-based side-channel attacks. Furthermore, the test authorization code is determined by the nonvolatile memory built into the chip to realize the inconsistency of the test authorization code for each chip.
Highlights
In recent years, several technologies, such as sensor networks [1,2,3,4], wireless communication [5,6,7,8], smart grid [9, 10], big data [11, 12], and internet of things [13, 14], have been developed rapidly and their security has been widely researched [15]
If the scan chain is not encrypted, sensitive information such as intellectual property (IP) or secret keys [26, 27] could be exposed to attackers. erefore, it is necessary to use a feasible solution to protect integrated circuits (ICs) from scan-based side-channel attacks [28]
In order to protect the encryption chip from scan-based side-channel attacks, in this paper, we propose a new scan design method
Summary
Several technologies, such as sensor networks [1,2,3,4], wireless communication [5,6,7,8], smart grid [9, 10], big data [11, 12], and internet of things [13, 14], have been developed rapidly and their security has been widely researched [15]. The design of scan chain to facilitate testing is proposed and widely used. Many scan-based attacks have been proposed to protect encryption systems. It prevents an attacker from switching between test mode and functional mode Another kind of methods obfuscate the scan output by changing the structure of the scan chain [51,52,53,54,55,56]. In order to protect the encryption chip from scan-based side-channel attacks, in this paper, we propose a new scan design method. In this method, only the user with the correct test authorization code can perform a normal scan.
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