Abstract
We propose a method to measure the pretilt angle as well as the cell gap in TN cells with low cell-gap with a single wavelength source. We use simple optical configurations with a TN cell between an analyzer and a polarizer. As we rotate the analyzer by 180°, we can find analyzer angles at which the transmittance is minimum or maximum under normal or oblique incidence. By using the measured analyzer angle, we can determine the pretilt angle.
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