Abstract
The relationship between the pressure-dependent electron attachment rate constants which have been observed in 1-C3F6 and in several perfluoroalkanes and the uniform field breakdown strengths (E/N)lim in these gases is discussed. Also discussed are the various types of synergistic behavior in (E/N)lim which have been observed in binary dielectric gas mixtures. For the latter, a new mechanism is outlined which explains the synergism observed in several gas mixtures where the (E/N)lim values of the mixtures are greater than those of the individual gas constituents, which we call positive synergism. Model calculations are presented which support this mechanism and can be used to explain the pressure-dependent synergistic effects which have been reported in 1-C3F6/SF6 and other gas mixtures. Experimentally observed ion–molecule reaction processes for several gases are discussed which support the proposed mechanism. Based on this mechanism, we outline several conditions which must be fulfilled in order to observe positive synergistic behavior in dielectric gas mixtures.
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