Present status of micro-spectroscopy at BL37XU

Abstract

X-ray micro-spectroscopy is a combination of X-ray absorption fine structure (XAFS) and various X-ray microscopy methods. This method is used in many scientific fields because it provides more sophisticated information, including valence information and local structure information obtained from XAFS, in addition to two-dimensional electron density or elemental distribution. This paper introduces the current status and recent developments of BL37XU, which provides micro-spectroscopy used as an analytical technique in a wide range of fields. Currently, scanning micro-spectroscopy using X-ray focusing optics and full-field micro-spectroscopy using a two-dimensional detector are the two main methods used. Here, we present recent developments of these two methods and the development of a micro-spectroscopy method using coherent diffraction imaging (CDI), which is seen to offer a higher resolution micro-spectroscopy in the next-generation synchrotron radiation.