Abstract
Titanium dioxide (TiO2) thin film has been successfully synthesized deposited on glass substrates by the sol–gel dip-coating method using freeze drying technique. The precursor and TiO2 film were characterized using thermogravimetric and differential scanning calorimetric (TG-DSC), X-ray diffraction (XRD) and atomic force microscopy (AFM) analysis technology. The preparation of the precursor sols and TiO2 film were described in detail. The XRD result demonstrates that the TiO2 film is well crystallized and consists of anatase phase only with (101) plane. The morphology of the nanoparticles of TiO2 thin film is spherical shape with grain size of 30.1 nm in average diameter and the surface of the TiO2 film is smooth. The freeze drying technique offers a novel process route in treating thin film for commercial applications
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