Abstract
Abstract TeO x –SiO 2 composite films having third-order nonlinearities were prepared by electrochemically induced sol–gel deposition method on ITO substrate. The third-order optical nonlinearities of the films were measured by Z-scan technique. The third-order nonlinear susceptibilities ( χ (3) ) of the as-prepared films are 5.9 × 10 −7 to 4.29 × 10 −6 esu. The surface morphology and composition of the films were characterized by SEM/EDX, which identified that Te metallic particles well dispersed in TeO x –SiO 2 gel films.
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