Abstract
Thin films of poly (methyl methacrylate) (PMMA) were prepared on cleaned glass slides by using spin coating technique. The prepared films were identified by using FTIR spectrum. Surface morphology of the coated films was studied by using SEM and AFM. Both as grown and annealed films showed smooth and amorphous structure. It also revealed the absence of pits, pin holes and dendritic features in the surface. Both as grown and annealed films showed very low RMS roughness value. The morphology analysis revealed that the prepared film could be used as dielectric layer in thin film transistors and as drug delivery system forwound healing.
Highlights
Thin films of poly (methyl methacrylate) (PMMA) were prepared on cleaned glass slides by using spin coating technique
Though lot of work has been reported on the preparation and characterization of Poly(methyl methacrylate) (PMMA) thin films, to the best of our knowledge, there is no report on the nanoscale thick PMMA films prepared by spin coating method
The FTIR spectrum of as grown PMMA thin film of 300 nm is shown in the Fig. 1
Summary
ABSTRACT Thin films of poly (methyl methacrylate) (PMMA) were prepared on cleaned glass slides by using spin coating technique. Surface morphology of the coated films was studied by using SEM and AFM. Both as grown and annealed films showed smooth and amorphous structure.
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