Abstract

The non-equilibrium tetragonal t' phase of yttria-stabilizedzirconia (YSZ) plays a key role in improving the toughness of YSZ ceramics owing to its own ferroelastic domain toughening mechanism. Due to the disadvantages of traditional processes for preparing the YSZ t' phase, which requires high heating temperature, difficult to control defects and inability to regulate microstructure, it is not conducive to the preparation of YSZ by these methods. We report the use of substrate clamping and non-equilibrium growth process of PLD to render stable t' epitaxial YSZ films with multiple domain structure on (0001) Al2O3 substrates. Thin film structure and epitaxial relationship with substrate were subsequently analyzed by XRD, RSM, and HRTEM. It was found that the crystal orientation of the YSZ film changes as a function of oxygen pressure during deposition. When oxygenpressure is larger than 100 mtorr, YSZ films with highly oriented ferroelastic domains are obtained. Based on the symmetry relationship, we know that the film has three in-plane domain structures. The epitaxial relationship between the film and the substrate is (002) [110] YSZ // (0001) [112¯0] Al2O3.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.