Abstract
MnBi composite films were prepared by annealing Bi–Mn multilayers which were deposited in vacuum by repeating an alternate evaporation of Bi and Mn metals. They were found to have a crystallite size of about one thousand angstroms and, moreover, to exhibit an orientation of the C-axis perpendicular to the film plane, as observed in MnBi single layers. A structure analysis by electron microscopy and a significant increase in the coercive force suggest that they have a multilayer structure. Their large coercive force enabled us to write-in reversed magnetic domains (as small as 1.2 µm in diameter) by the irradiation of a single-pulse Baser beam. No significant difference was found in the magnetization, Kerr rotation or reflectivity between composite MnBi films and single-layer MnBi films.
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