Abstract
CdSe thin films were deposited on a glass substrate by using vacuum thermal evaporation technique. The deposited films were annealed to 350˚C for (10, 20, 30) minutes respectively. Structural, morphological, optical and electrical properties of the films were studied by using X-ray diffraction (XRD), ultraviolet-visible (UV-Vis) spectroscopy; and Atomic force microscope (AFM). The X-ray diffraction pattern showed that the film has a cubic phase with preferred orientation (111), the grain size was found to be in the range of( 31-46)nm. The UV tests explain that the energy bandgap decrease with increasing of annealing time from 2.43eV to 2.17eV after 20minute annealed.
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