Abstract
Thin films of the heavy-fermion compound CeCu 6 were prepared by co-sputtering from two high-purity targets of Ce and Cu. We used electron probe microanalysis and Rutherford backscattering to determine composition and thickness, Auger electron spectroscopy for depth profile analysis and X-ray diffraction to check crystallinity. The films were found to be of high quality. Resistivity and magnetoresistance measurements as a function of temperature (0.03–300 K) on films of thicknesses ca. 200 nm mimic the properties of bulk CeCu 6. Based upon these transport measurements we have evidence for the formation of a strongly correlated electron state in our films.
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