Preparation and Study on the Electric Properties of PI-Al<sub>2</sub>O<sub>3</sub> /PI-TiO<sub>2</sub>/PI-Al<sub>2</sub>O<sub>3 </sub>Three Layers Nanocomposite Films

Abstract

Polyimide-Al2O3 nanocomposite films were prepared via simple mechanical blending of Polyimide and surface modified Al2O3, and Polyimide-TiO2 nanocomposite films were prepared by the polymerization process of adding tetrabutyl orthotitanate (TBOT) and the coupling agent isocyanatopropyltriethoxysilane (ICTOS) in polyimide. The three layers nanocomposite films were characterized by scanning electron microscope (SEM). The homogeneous dispersion is observed by the SEM when the concentration of Al2O3 is low. The electrical properties of the nanocomposite films were investigated as a function of the concentration of the Al2O3 nanoparticles. The results show that the dielectric constant and the dielectric loss (tan δ) of these films increased with the increase of the content of silica particles.