Preparation and study of microstructures, optical properties and oscillator parameters of titanium (IV) oxide (TiO2) film

Abstract

In this study, Titanium (IV) Oxide (TiO2) film has been prepared and characterized by X-ray diffraction (XRD). The XRD pattern of TiO2 film of anatase phase exhibit very sharp peaks at 25° and 47.85°. According to Scherrer’s formula the grain size of anatase (101) phase TiO2 nananoparticle is 38.5 nm. The optical properties and constants of TiO2 film of thickness (4 μm) have been investigated at room temperature. The transmittance, reflectance and absorbance spectra are measured in the wavelength range (340–900 nm). Optical constants of TiO2 film are derived from the transmission spectra and the refractive index dispersion of the film. The oscillator energy, E0 dispersion energy, Ed, the static refractive index, n0, and other parameters have been determined by the single oscillator Wemple-DiDomenico method. This film can be used in the form of thin film in dye-sensitized solar cells.