Abstract
Ag0.8Cu0.2InSe2 (ACIS) alloys and thin films have been fabricated with different vacuum annealing temperatures Thin film has been deposited by thermal evaporation method of vacuum of 1.3*10-6 Torr with thickness about 700 nm at R.T and vacuum annealing at temperatures (373,473) K for 1 hour. The deposition in a vacuum on glass substrates. The crystal structure of deposited thin film had been examined by XRD and AFM analysis, which confirms the formation of tetragonal phase in 112 direction and these films are polycrystalline in nature having ideal stoichiometric. The optical properties of these films are determined for the wavelength range 400 - 1000 nm. The band gap of the Ag0.8Cu0.2InSe2 films was evaluated to be (1.48-1.42) eV.
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