Abstract
YBa2Cu3O7 superconducting thin films were deposited onR-plane sapphire substrates with Yttria-stabilized zirconia buffer layer by laser ablation. The structure of the films was characterized by X-ray diffraction. Superconducting transitional temperatures as high as ≥90 K and critical current densities up to 2.2×106 A/cm2 (77 K) were achieved. The results of Auger depth profile showed that no obvious diffusion occurred between the substrate and the YBa2Cu3O7 thin film.
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