Preparation and Performance of the Sm0.2Ce0.8O1.9- Single Buffer Layer Fabricated with Dip-Coating

Abstract

Abstract An epitaxial Sm 0.2 Ce 0.8 O 1.9- x (SCO) single buffer layer with thickness of about 250 nm has been deposited via dip-coating polymer-assisted chemical solution deposition (PACSD) approach for YBCO coated conductors on bi-axially textured Ni-5%W (200) alloy substrate. Flat, crack-free SCO films with sharp (200) c -axis orientation and texture have been obtained by carefully controlling the concentration of precursor solution, withdrawing speed, annealing temperature and dwelling time. Leaving other three factors unchanged, focuses on the influence of different withdrawing speeds on the performance of the SCO buffer layer has been focused on. YBCO superconducting layer has been deposited equally via dip-coating PACSD approach on the SCO-buffered NiW, showing a bi-axially texture. Micro-structural investigations revealed a homogeneous surface structure. Both of these indicate that SCO single buffer layer can function well as template. The approach has shown a promising way to fabricate long-length, low-cost YBCO coated conductors.