Abstract

A series of CoxAg1−x (0 ≤x < 100 at.%) granular films were deposited onto glass substrates with the thickness on the order of 400 nm using the ion-beam cosputtering technique at different substrate temperatures. Systematical investigations were made on the Giant MagnetoResistance (GMR) effect and microstructures in these thin granular films. The magnetoresistance ratio strongly depends on cobalt concentration, substrate temperature, and the optimal value of GMR was observed in Co22Ag78 sample prepared at a temperature of 300 K. Microstructures of these films are closely related to the fabricating process, and thus influence the GMR.

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