Abstract
The clear precursors of M x Y 2− x SiO 5 (M=Eu, Sm, and Ce) were successfully synthesized by a metallorganic decomposition (MOD) technique for the first time. Dense and crack-free yttrium silicate (Y 2SiO 5)-based thin films appear to have the X 1–Y 2SiO 5 structure on quartz substrates after annealing above 900°C. The photoluminescence (PL) and triboluminescence (TL) of these films were investigated. Results show that the europium-activated Y 2SiO 5 thin films possess higher PL and TL properties than the other Y 2SiO 5 thin films activated with Ce and Sm ions. The PL intensity is so strong that the red light emission at 611 nm is visible to the naked eye. The high TL intensity appears in the pure Y 2SiO 5 thin film but it does not exist in the bulk material. This indicates that preparation of luminescent films is not only beneficial for the fabrication of a planar display but also for improvement in the luminescent property.
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