Abstract
Films of the binary compound AgI and the two-phase composite 0.7AgI · 0.3ZnO have been produced using laser ablation. The temperature dependences of the electrical resistivity of samples prepared in the form of AgI pellets pressed from a fine-grained powder and samples in the form of films of the AgI compound and the 0.7AgI · 0.3ZnO two-phase composite have been investigated using impedance spectroscopy. The sizes of particles in all the samples studied have been estimated by the Scherrer method. It has been shown that zinc oxide in the 0.7AgI · 0.3ZnO two-phase composite can play the role of an dispersing agent for AgI crystallites. The phase compositions of the initial materials and films, as well as the degree of stress of crystals in all the samples under investigation, have been examined using X-ray diffraction analysis. It has been demonstrated that diffraction reflections from 0.7AgI · 0.3ZnO two-phase composite films are shifted toward shorter interplanar distances as compared to the reflections from the other samples, which indicates the presence of mechanical stresses in this composite.
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