Abstract
Bi doped Nb2O5 oxide thin films were prepared by multi target radio frequency reactive sputtering in a gas mixture of argon and oxygen at 500°C. The films were amorphous according to a crystalline evaluation by X-ray diffraction. It was inferred from the result of the surface observation in the scanning electron microscope image that the mixture films created a corpuscle. X-ray photoelectron spectroscopy revealed that a chemical bond has changed by making a mixture film. These properties of prepared films strongly depended on the amount of Bi, and the films display a blue light burnt umber, burnt umber or black coloration after Li+ and electron insertion.
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