Abstract

MgS thin films have been successfully prepared using low cost spray pyrolysis technique. Magnesium sulphate (MgSO4·7H2O) was the source of Mg2+ while sodium thiosulphate served as the source of S2−. Ethylene diamine tetra acetic acid (EDTA) was used to slow down the reaction rate. The aim of this study is to establish the optimized experimental conditions needed to grown MgS thin films. X ray diffraction and atomic force microscopy (AFM) techniques are used to examine the effect of the concentration of the agent complexant EDTA used to grow MgS thin films. The structural analysis shows the formation of MgS thin film with preferential orientation (200) for sprayed solution containing EDTA. It is revealed also the diffraction peaks belonging to the MgSO4 thin films crystallizing in orthorhombic structure. All samples were well adhered to the substrate as revealed from AFM images. The optical properties of MgS thin films were investigated using spectrophotometric measurements in the wavelength range 250–2500 nm. These films, because of their low reflectance and high transmittance in the infrared regions, are suitable for coatings on different types of solar collectors.

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