Abstract

Thin films of YBa 2 Cu 3 O y are grown on (100) oriented MgO and SrTiO 3 substrates via planar dc-magnetron sputtering at high pressure. At optimized deposition parameters we obtained epitaxially grown, c-axes oriented films of high quality. Structure and orientation are determined by x-ray and channeling experiments, stoichiometry by RBS measurements. The surfaces of the films are very smooth. Force microscopy reveals a surface roughness less than 10 nm. The morphology of the surface is described by an arrangement of hillocks of an elliptic form, which might result from a growth mechanism on the base of screw dislocations. The films were structured by ion beam etching. Bridges with widths down to 1 μm were formed without detectable degradation of the superconducting properties.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.