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Abstract
Thin 33S samples for the study of the 33S(n,α)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.
Highlights
The preparation of thin sulfur samples is a difficult task because sulfur sublimates in vacuum at room temperature, adheres poorly or only for a short time to most solid backings and it is very volatile [1,2,3,4]
The method is based on the evaporation in vacuum of 33S powder onto a dedicated substrate and the characterization is based on Rutherford backscattering spectrometry (RBS)
The characterization by RBS performed at CNA has allowed an accurate determination of the number of 33S atoms per unit of area present in the samples
Summary
The preparation of thin sulfur samples is a difficult task because sulfur sublimates in vacuum at room temperature, adheres poorly or only for a short time to most solid backings and it is very volatile [1,2,3,4]. The cross-section is expected to be high in the resonance region but for resolving the resonances a pulsed neutron beam is mandatory entailing a decrease of the neutron flux With all of this in mind and with the knowledge of the outstanding characteristics of the Experimental Area 1 (EAR1) of the n_TOF-CERN facility in terms of energy resolution and instantaneous flux, it is possible to take advantage of a higher number of neutrons making use of the beam of 8 cm diameter during the so-called fission campaign when the large collimator is installed [7]. The method is based on the evaporation in vacuum of 33S powder onto a dedicated substrate and the characterization is based on Rutherford backscattering spectrometry (RBS)
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