Abstract
A compositionally graded SmCo film has been prepared by magnetron sputtering using a Co target partially covered by a Sm foil. The film was deposited onto a 100 mm thermally oxidised Si substrate and then annealed ex-situ. The SmCo film has been used as a test sample to validate an in-house developed scanning MOKE (Magneto-Optic Kerr effect) system incorporating a pulsed magnetic field source capable of producing fields as high as 10 T. A 2D array of hysteresis loops was measured across the entire wafer. The evolution in coercivity measured along a selected 1D strip of the sample is correlated with changes in composition and crystallographic structures measured using Energy Dispersive Spectroscopy and X-ray diffraction. The high field Scanning MOKE system holds much potential for optimizing the extrinsic properties of known hard magnetic phases as well as in the search for new hard magnetic phases.
Highlights
Preparation and characterisation of compositionally graded SmCo filmsAndre Dias,[1,2] Gabriel Gomez,[1,2] Dominique Givord,[1,2,3] Marlio Bonfim,[4] and Nora M
Combinatorial thin film studies are being used for the screening and optimization of a range of functional materials.[1]
In this paper we report on the preparation and characterisation of a compositionally graded SmCo film, as a test-sample to demonstrate the capabilities of our scanning Magneto-Optic Kerr effect (MOKE) system
Summary
Andre Dias,[1,2] Gabriel Gomez,[1,2] Dominique Givord,[1,2,3] Marlio Bonfim,[4] and Nora M. Dempsey1,2 1Institut NEEL, Universite Grenoble Alpes, F-38000 Grenoble, France 2CNRS, Institut NEEL, F-38000 Grenoble, France 3Instituto de Fısica, Universidade Federal do Rio de Janeiro, Rio de Janeiro, Brazil 4DELT, Universidade Federal do Parana, Curitiba, Brazil (Presented 2 November 2016; received 27 September 2016; accepted 18 November 2016; published online 23 February 2017)
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