Preparation and analysis of Ag2Se1-xTex thin film structure on the physical properties at various temperatures by thermal evaporation

Abstract

Chemical spray pyrolysis (CSP) was utilized to create pure Zinc Sulfide (ZnS) and magnesium (Mg) doped thin films on a clean glass substrate at a temperature equal to 400°C. X-ray diffraction test revealed a cubic wurtzite crystal structure with average crystallite sizes of 10.99 and 12.27 nm for ZnS and ZnS: Mg, respectively. XRD analysis of the doped films revealed a polycrystalline structure with a predominant peak along the (220) plane and additional peaks along the (111), (200), and (222) planes. The grain size raised from 10.99 to 12.27 nm as a result of the XRD patterns. The increase in Mg content from 0% to 3%, affect the bandgap that fell from 3.52 to 3.42 eV. As the Mg content increased, the transmittance and refractive index of the films was lowered.