Abstract
A method is presented which allows us to quantity the information contained in high-resolution electron micrographs by the measurement of the intensity of reflections in diffractograms. Due to transfer gaps of the contrast transfer function and in order to extend the experimental information, focus series are applied. As final results the imaging parameters are determined simultaneously with the amplitudes and phases of the Fourier components of the exit-surface wave function. The procedure is tested using images simulated close to realistic conditions and proven to work. First results from an application to experimental focus series are presented.
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