Abstract
The aim of this work is to use the information coming from the spectral region corresponding to inelastic scattering of the incident X-rays obtained under total reflection conditions to classify synthetic and natural polymers through chemometric techniques. Total reflection X-ray fluorescence (TXRF) spectra were obtained and analyzed to retrieve matrix information from aqueous solutions of several polymers in concentrations up to 1% (m/m). The profile of the incoherent scattered peaks was especially selected for this purpose. Using a combination of principal component analysis and cluster analysis, a preliminary classification of polymer was intended.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
