Abstract
The symmetrized harmonic method of correcting diffracted X-ray intensities for preferred orientation in powder samples is applied to tetragonal crystals. According to model calculations the measurement of intensity variation of three or four favourable reflections in a limited range of polar angle (αmax about 50 to 60°) makes possible reliable corrections for all reflections, when the distribution of crystallites is regular. After correction for preferred orientation, the residual differences in the test measurements on nickel fluoride and zinc fluoride samples were of the order of ½%, while the largest corrections were 10 to 15%.
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