Abstract
Using 8-fold symmetric YBa2Cu3O7−x (YBCO) seed films deposited on MgO substrates, a new preferential growth of YBCO with 45° in-plane alignment was found under pure oxygen atmosphere. Unique YBCO films with pure 45° in-plane orientation were then grown, and the atomic configuration of interfaces between the 45° YBCO grains and MgO was carefully investigated by high-resolution transmission electron microscopy. Peculiar interfacial bottom layers were found to strongly relate to the thermal stability of the in-plane alignment of YBCO films under different oxygenation conditions. Field-dependent critical current density of pure 45° and 0° YBCO films was measured and compared. Thus, the effect of the interfacial structure on critical current density was inferred.
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