Abstract
In this brief, a novel methodology for the prediction of three phenomena related to the interconnects in VLSI circuits will be presented. First, the power (including crosstalk-induced power) prediction for ultradeep submicron ICs and nano systems is proposed. The novelty of the method for crosstalk prediction is deduced by employing a polynomial progressive calibration. Second, as a part of this methodology, we present a new solution for power prediction of through-silicon-vias.
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